Ionizing radiation effect on 10-bit bipolar A/D converter

查看全文 作　　者：CHEN [1,2,3]Rui;LU [1,2]Wu;REN [1,2]Diyuan;ZHENG [1,2,3]Yuzhan; WANG [1,2,3]Yiyuan; FEI [1,2,3]Wuxiong;LI [1,2,3]Maoshun;LAN [1,2,3]Bo;CUI [1,2,3]Jiangwei 机构地区：[1]Xinjiang Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Urumqi 830011, China;[2]Xinjiang Key Laboratory of Electronic Information Material and Device, Urumqi 830011, China;[3]Graduate University of Chinese Academy of Sciences, Beijing 100049, China 出　　处：《Nuclear Science and Techniques》索引2010年第21卷第3期,共5页 摘　　要：In this article,radiation effects and annealing characteristics of a bipolar analog-to-digital converter(ADC) are investigated in different biases and dose rates.The results show that ADC is sensitive to both the bias and dose rate. Under high-dose-rate irradiation,the ADC functions well,while under low-dose-rate irradiation,the parameters of ADC change obviously at low dose level,and the damage is significant at zero bias.Combining the fringing field with the space charge model,the underlying mechanism for this response is discussed. 关 键 词：数字转换器 辐射效应 双极性 电离辐射 低剂量率 ADC 退火特性 参数变化