维普期刊资源整合服务平台（V6.5）

56篇 您的检索式：作者名="Bhuva B"

选中清除导出查看参考文献查看引证文献引用追踪共3页首页上一页第1页下一页末页 /3 跳转

	题名	作者	年代	出处	被引量
1	Effect of well and substrate potential modulation on single event pulse shape in deep submicron CMOS 显示文摘	DASGUPTA S WITULSKI A F BHUVA B L	2007	IEEE Transactions on Nuclear Science2007，54，6：	1
2	Simulation of worst-case total dose radiation effects in CMOS VLSI circuits显示文摘	Bhuva B Paulos J J Diehl S E	1986	IEEE Trans Nucl Sci1986，33，6：	1
3	Charac- terization of digital single event transient pulse-widths in 130 nm and 90 nm CMOS technologies显示文摘	Narasimham B Bhuva B Schrimpf R	2007	IEEE Trans Nucl Sci2007，54，6：	1
4	Single-event transient pulse quenching in advanced CMOS logic circuits 显示文摘	AHLBIN J R MASSENGILL L W BHUVA B L	2009	IEEE Trans Nucl Sci2009，56，6：	1
5	A Hardened-by-design Technique for RF Digital Phase-locked Loops显示文摘	Loveless T D Massengill L W Bhuva B L	2006	IEEE Transactions on Nuclear Science2006，53，6：	1
6	A Hardened-by-Design Technique for RF Digital Phase-Locked Loops显示文摘	Loveless T D Massengill L W Bhuva B L	2006	IEEE Trans on Nuclear Science2006，53，6：	1
7	The effectiveness of passiveultrasonic irrigation on intraradicular Enterococcus faecalis bio-films in extracted single-rooted human teeth显示文摘	Bhuva B Patel S Wilson R	2010	Int Endod J2010，43，3：	1
8	The use of limited cone beam computed tomography in the diagnosis and management of a case of perforating internal root resorption显示文摘	Bhuva B Barnes J J Patel S	2011	Int Endod J2011，44，8：	1
9	All Si-based optical interconnect for interchip signal transmission显示文摘	Chatterjee A Mongkolkachit P Bhuva B	2003	IEEE Photonic Technology Letters2003，15，11：	1
10	RHBD techniques for mitigating effects of single-event hits using guard-gates 显示文摘	Balasubramanian A Bhuva B L Black J D	2005	IEEE Transactions on Nuclear Science2005，52，6：	1
11	The effectiveness of passive ultrasonic irrigation on intraradicular Enterococcus faecalis biofilms in extracted single-rooted human teeth显示文摘	Bhuva B Patel S Wilson R	2010	Int Endod J2010，43，3：	1
12	On-chip characterization of single event transient pulsewidths 显示文摘	Narasimham B Ramachandran V Bhuva B	2006	IEEE Transactions on Device and Materials Reliability2006，6，4：	1
13	The use of limited cone beam com- puted tomograplly in the diagnosis and management of a case of perforating internal root resorption 显示文摘	Bhuva B Barnes J J Patel S	2011	Int Endod J2011，44，8：	1
14	Design technique for mitiga- tion of alpha-particle-induced single-event transients in combinational logic 显示文摘	Mongkolkachit P Bhuva B	2003	IEEE Transactions on Device and Materials Reliability2003，3，3：	1
15	Simulation of worst case total dose radiation effects in CMOS VLSI circuits显示文摘	Bhuva B L Paulos J J Diehl S E	1986	IEEE Trans on Nuclear Science1986，33，6：	1
16	Circuit technique for threshold voltage stabilization using substrate bias in total dose environment 显示文摘	Shreedhara J K Bamaby H J Bhuva B L	2000	IEEE Transactions on Nuclear Science2000，47，6：	1
17	Switch level simulation of total dose effects on CMOS VLSI circuits显示文摘	Bhuva B L Paulos J P Gyurcsik R S	1989	IEEE Trans on Compurer-Aided Design of Integrated Circuits and Systems1989，8，9：	1
18	On- Chip Characterization of Single-Event Transient Pulsewidths 显示文摘	Narasimham B Ramachandran V Bhuva B L	2006	IEEE Trans on Device and Materials Reliability2006，6，4：	1
19	The effectiveness of pas- sive ultrasonic irrigation on intraradicular Enterococcus faecalis biofilms in extracted single-rooted human teeth显示文摘	Bhuva B Patel S Wilson R	2010	Int Endod J2010，43，3：	1
20	Single-Event Tolerant Flip-Flop Design in 40 nm Bulk CMOS Tech-nology显示文摘	Jagannathan S Loveless T D Bhuva B L	2011	IEEE Trans Nucl Sci2011，58，6：	1

返回顶部每页显示：

共3页首页上一页第1页下一页末页 /3 跳转

互联网出版许可证新出网证(渝)字10号全国400电话 - 免长途话费

用户提示