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14篇 您的检索式:作者名="KILAAS R"
    题名 作者 年代 出处 被引量
1Quantitative measurement of displacement and strain fields from HREM micrographs显示文摘H(y)tch M J Snoeck E Kilaas R 0,,03:1
2Quantitative measurement of displacement and strain fields from HREM micrographs显示文摘H(y)tch M J Snoeck E Kilaas R 0,,:1
3Quantitative measurement of displacement and strain fields from HREM micrographs显示文摘Hytch M J Snoeck E Kilaas R 1998Ultramicroseopy1998,74,:1
4Nickel accumulation and nickel oxalate precipitation by Aspergillus niger显示文摘MAGYAROSY A LAIDLAW R D KILAAS R 2002Appl Microbiol Biotechnol2002,59,:1
5Quantitative measurement of displacement and strain fields from HREM micrographs显示文摘H?tch M J Snoeck E Kilaas R 0,,:1
6Quantitative measttrement of displacement and strain fields from HREM micrographs显示文摘H(Y)TCH M J SNOECK E KILAAS R 0,,:1
7Structure and morphology of S-phase precipitates in aluminum显示文摘Radmilovic V Kilaas R Dahmen U 1999Acta Mater1999,47,:1
8Structure and morphology of S-phase plcipitates in aluminum 显示文摘Radmilovic V Kilaas R Dahmen U 1999Acta Materialia1999,47,1516:1
9Structure and morphology of S-phase precipitates in aluminum 显示文摘RADMILOVIC V KILAAS R DAHMEN U SHIFLET G J 1999Acta Materialia1999,47,:1
10Nickel accumula- tion and nickel oxalate precipitation by Aspergillus niger 显示文摘Magyarosy A Laidlaw R D Kilaas R 2002Ap- plied Microbiology and Biotechnology2002,59,23:1
11Structure and morphology of S-phase precipitates in aluminum显示文摘Radmilovic V Kilaas R Dahmen U 1999Acta Materialia1999,47,1516:1
12Imaging columns of the light elements carbon,nitrogen and oxygen with sub-Angstrom resolution显示文摘Kisielowski C Hetherington C J D Wang Y C Kilaas R Keefe M A O' Thust A 2001Ultramicroscopy2001,89,:1
13Structure and morphology of S-phase precipitates in aluminum显示文摘RADMILOVIC V KILAAS R DAHMEN U SHIFLET G J 1999Acta Mater1999,47,1516:1
14Ferroelectric domain walls in BaTiO3:Fingerprints in XRPD diagrams and quantitative HRTEM image analysis 显示文摘Floquet N Valot C M Mesnier M T Niepce J C Nor- mand L Thorel A Kilaas R 1997Journal De Physique Iii1997,7,6:1
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