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11篇 您的检索式:作者名="S Tarnick"
    题名 作者 年代 出处 被引量
1Built-in test for cir- cuits with scan based on reseeding of multiple-polynomial linear feedback shift register显示文摘Hellebrand S Rajski J Tarnick S 1995IEEE Trans on Computers1995,44,2:1
2Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers显示文摘Hellebrand S Rajski J Tarnick S 1995IEEE Trans on Comp1995,44,2:1
3Built-in Test for Circuits with scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers显示文摘S Hellebrand J Rajski S Tarnick etall 1995IEEE Trans on Comp1995,44,2:1
4Built in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers显示文摘Hellebrand S Rajski J Tarnick S 1995IEEE Transactions on Computers1995,44,2:1
5Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers显示文摘Hellebrand S Rajski J Tarnick S 1995IEEE Transactions on Computers1995,44,2:1
6Built-In Test for Circuits with Scan Based on Reseeding of Multiple-polynomial Linear Feedback Shift Registers显示文摘Hellebrand S Rajski J Tarnick S 1995IEEE Trans on Computers1995,44,2:1
7Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers显示文摘Hellebrand S Rajski J Tarnick S 1995IEEE Transactions on Computer1995,44,2:1
8Buih-in test for circuits with scan based on reseeding of muhiplepolynomial linear feedback shift registers显示文摘HELLEBRAND S RAJSKI J TARNICK S 1995IEEE Trans on Comp1995,44,2:1
9Builtin test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers显示文摘Hellebrand S Rajski J Tarnick S 1995IEEE Trans on Computers1995,44,2:1
10Built in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers显示文摘Hellebrand S Rajski J Tarnick S 1995IEEE Trans Computers1995,44,2:1
11Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers 显示文摘Hellebrand S Rajski J Tarnick S 1995IEEE Transactions on Computers1995,44,2:1
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