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3篇 您的检索式:作者名="SHEU Gene"
    题名 作者 年代 出处 被引量
1A High Performance Silicon-on-Insulator LDMOSTT Using Linearly Increasing Thickness Techniques显示文摘我们在场在侧面的双 diffused metal-oxide-semiconductor 晶体管完成一致侧面的电场和最大的故障电压的一种新技术在 silicon-on-insulator 上制作了底层。到排水管的从来源的线性地增加的飘移区域厚度被采用在设备改进电场分发。比作侧面的线性做技术和减少的表面地技术,新设备展出的二维的数字模拟表演减少了操作的特定的在抵抗上,最大的离开状态和在状态上故障电压,优异伪浸透特征和改进保险箱区域。[从作者抽象]GUO Yu-Feng WANG Zhi-Gong SHEU Gene CHENG Jian-Bing 2010Chinese Physics Letters2010,27,6:2
2Comparison of high vohage(200 - 300vohs) lateral power MOSFETs for power integraed circuits显示文摘SHEU Gene LIN Yinghuang TSENG Wenchin 2010ECS transactions on Design and Device Engineering2010,27,1:1
3Analytical models of lateral power devices with arbitrary vertical doping profiles in the drift region显示文摘By solving the 2D Poisson's equation, analytical models are proposed to calculate the surface potential and electric field distributions of lateral power devices with arbitrary vertical doping profiles. The vertical and the lateral breakdown voltages are formulized to quantify the breakdown characteristic in completely-depleted and partially-depleted cases. A new reduced surface field (RESURF) criterion which can be used in various drift doping profiles is further derived for obtaining the optimal trade-off between the breakdown voltage and the on-resistance. Based on these models and the numerical simulation, the electric field modulation mechanism and the breakdown characteristics of lateral power devices are investigated in detail for the uniform, linear, Gaussian, and some discrete doping profiles along the vertical direction in the drift region. Then, the mentioned vertical doping profiles of these devices with the same geometric parameters are optimized, and the results show that the optimal breakdown voltages and the effective drift doping concentrations of these devices are identical, which are equal to those of the uniform-doped device, respectively. The analytical results of these proposed models are in good agreement with the numerical results and the previous experimental results, confirming the validity of the models presented here.花婷婷 郭宇锋 于映 Gene Sheu 蹇彤 姚佳飞 2013Chinese Physics B2013,22,5:0
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