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32篇 您的检索式：作者名="Silfhout"

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	题名	作者	年代	出处	被引量
1	Reliability of wirebonds in micro-electronic packages显示文摘	van Driel W D van Silfhout R B R Zhang G Q	2008	Microelectronics International2008，，2：	1
2	An investigation of the interaction of N2O with the Si (111)-7 × 7surface suing AES and optical reflectometry; a comparison with O2 显示文摘	KEIM E G SILFHOUT A V	1985	Surface Science1985，，2：	1
3	Meiotic Polyploidization in Five Different Interspecific Lilium Hybrids显示文摘	Tuyl J M Gonzalez R B Silfhout A A	2005	Acta Hort2005，673，：	1
4	Short-term effec- tiveness of an online behavioral training in migraine self-man- agement: A randomized controlled trial显示文摘	Kleiboer A Sorbi M van Silfhout M	2014	Behav Res Ther2014，61，：	1
5	Yr15 a new gene for resistance to Puccinia striiforrnis in Triticum dicoccoides sel G - 25 显示文摘	Gerechter Amitai Z K Van Silfhout C H Grama A	1989	Euphytica1989，43，：	1
6	Superhydrophobic Surfaces by Anomalous Fluoroalkylsilane Self-Assembly on Silica Nanosphere Arrays显示文摘	Raza MA Kooij ES van Silfhout A Poelsema B	2010	Langmuir2010，26，12：	1
7	Meiotic polyploidization in five different interspecific Lilium hybrids 显示文摘	VAN TUYL J M BARBA-GONZALEZ R VAN SILFHOUT A A	2002	Acta Hortic2002，，573：	1
8	A reliable,precise method to differentitate species of root-knot nematode in mixtures on the basis of ITS-RFLP显示文摘	Zijlstra C Uenk B J van Silfhout C H	1997	Fundam Appl Nematol1997，20，1：	1
9	A high-precision X-ray beam-position and profile monitor for synchrotron beamlines显示文摘	van Silfhout R G	1999	J Synchrotron Rad1999，6，：	1
10	Prediction of delamination related IC & packaging reliability problems 显示文摘	VAN DRIEL W D VAN GILS M A J VAN SILFHOUT R B R	2005	Microeleetron Reliab2005，45，91011：	1
11	Update on Kleefstra syndrome显示文摘	Willemsen MH Vulto-van Silfhout AT Nillesen WM	2011	Mol syndromol2011，2，：	1
12	显示文摘	Aarnink W A M Weishaupt A van Silfhout A	1990	Appl Surf Sci1990，，45：	1
13	Adult plant resistance to yellow rust in wild emmer wheat显示文摘	Van Silfhout C H Gerechter-Amitai Z K	1988	Netherlands Journal of Plant Pathology1988，94，：	1
14	Prediction of delamination related IC&packaging reliability problems显示文摘	VAN DRIEL W D VAN GILS M A J VAN SILFHOUT R B R	2005	Microelectron Reliab2005，45，91011：	1
15	Progenies of allotriploids of Oriental X Asiatic lilies (Lili- urn) examined by GISH analysis 显示文摘	Barba-Gonzalez R Van Silfhout A Visser R G F	2006	Euphytica2006，151，2：	1
16	Prediction of delamination related IC&packaging reliability problems显示文摘	VAN DRIEL W D V AN GILS M A J VAN SILFHOUT R B R	2005	Microelectron Reliab2005，45，91011：	1
17	Fibre-optic coupling to high-resolution CCD and CMOS image sensors显示文摘	Van Silfhout R G Kachatkou A S	2008	Nuclear In- struments and Methods in Physics Research Section A: Accel- erators Spectrometers Detectors and Associated Equipment2008，597，23：	1
18	Fibre-optic coupling to high-resolution CCD and CMOS image sensors 显示文摘	Van Silfhout R G Kachatkou A S	2008	Nuclear Instruments and Methods in Physics Research A 597 (2008)2008，，：	1
19	A reliable,precise method to differentiate species of root-knot nematodes in mixtures on the basis of ITS-RFLPs显示文摘	Zijlstra C Uemk BJ Van Silfhout CH	1997	Fundam appl Nematol1997，20，1：	1
20	Prediction of crack growth in IC passivation layers显示文摘	He Y T Van Grls M A J Van Driel W D Zhang G Q Van Silfhout R B R Ernst L J	2004	Microelectronics Reliability2004，44，12：	1

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