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30篇 您的检索式：作者名="Zorian Y"

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	题名	作者	年代	出处	被引量
1	Challenges in testing core-based System ICs 显示文摘	Marinissen J E Zorian Y	1999	IEEE Communications Magazine1999，37，6：	1
2	An effective built-in selftest scheme for parallel multipliers显示文摘	Gizopoulos D Paschalis A Zorian Y	1999	IEEE Transactions on Computers1999，48，9：	1
3	Test of future system-on-chips显示文摘	Zorian Y Dey S Rodgers M J	2000	Computer Aided Design2000，，：	1
4	Testing embedded-core based system chips显示文摘	ZORIAN Y MARINISSEN E J DEY S	1999	IEEE Computer1999，32，6：	1
5	Minimal march tests for dynamic faults in random access memories 显示文摘	HARUTUNYAN G VARDANIAN V A ZORIAN Y	2006	IEEE Proceedings of the Eleventh IEEE European Test Symposium ( ETS'' 06)2006，，：	1
6	Challenges in testing core-based system Ics显示文摘	MARINISSEN E J ZORIAN Y	1999	IEEE Communications Magazine1999，37，6：	1
7	A structured testability approach for multi chip boards based on BIST and boundary scan显示文摘	Zorian Y	1994	IEEE Trans Components Packaging and Manufacturing Technology-Part B1994，17，3：	1
8	An effective BIST scheme for ROMS 显示文摘	Zorian Y Ivanov A	1992	IEEE Trans Computers1992，41，5：	1
9	Testing embeddedcore-based system chips显示文摘	Zorian Y Marinissen E J Dey S	1999	IEEE Computer1999，32，6：	1
10	Faults models and tests for ring address type FIFOs显示文摘	VAN DE GOOR A J ZORIAN Y	1994	IEEE Design & Test of Computer1994，10，2：	1
11	Challenges in testing corebased system ICs显示文摘	Marinissen J E Zorian Y	1999	IEEE Communications Magazine1999，37，6：	1
12	Testing Embedded-Core Based System Chips显示文摘	ZORIAN Y MARINISSEN EJ DEY S	1999	Computer1999，32，6：	1
13	Embedded-memory test and repair: infrastructure IP for SoC yield显示文摘	ZORIAN Y SHOUKOURIAN S	2003	IEEE Des Test Comput2003，20，3：	1
14	Testing embedded-core based system chips显示文摘	ZORIAN Y MARINISSEN E J DEY S	1999	Computer1999，32，6：	1
15	SoC yield optimization via an embedded-memory test and repair infrastructure显示文摘	Shoukourian S Vardanian V Zorian Y	2004	IEEE Design & Test of Computers2004，21，3：	1
16	Challenges in testing corebased system ICs显示文摘	MARINISSEN E J ZORIAN Y	1999	IEEE Communications Magazine1999，37，6：	1
17	IEEE std 1500 enables modular SoC testing显示文摘	MARINISSEN E J ZORIAN Y	2009	IEEE Design & Test & Comput- ers2009，26，1：	1
18	SoC yield optimization via an embedded-memory test and repair infrastructure显示文摘	Shoukourian S Vardanian V Zorian Y	2004	IEEE Design & Test of Computers2004，21，3：	1
19	Test of RAM-Based FPGA: methodology and application to the interconnect 显示文摘	RENOVELL M FIGUERAS J ZORIAN Y	1997	Proceedings of the 15th IEEE VLSI Test Symposium1997，，：	1
20	Testing the interconnect of RAM-based fPGAs 显示文摘	RENOVELL M FIGUERAS J ZORIAN Y	1998	Proceedings of IEEE Design & Test of Computers1998，，15：	1

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