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| 1 | 基于FPGA的三模冗余容错技术研究显示文摘基于SRAM的FPGA对于空间粒子辐射非常敏感,很容易产生软故障,所以对基于FPGA的电子系统采取容错措施以防止此类故障的出现是非常重要的。三模冗余(TMR)方法以其实现的简单性和效果的可靠性而被广泛用于对单粒子翻转(SEU)进行容错处理。但传统TMR方法存在系统硬件资源消耗较多且功耗较大等问题。总结了传统TMR方法存在的问题,分析了一些近年来出现的改进的TMR方法的优劣,针对其存在问题指出了改进策略,并展望了TMR技术的发展趋势。 | 张超 赵伟 刘峥 | 2011 | 现代电子技术2011，34，5： | 18 |
| 2 | 美国几架航天飞机所发生的SEU研究显示文摘本文对1991年美国发射的5架不同倾角不同高度的低地球轨道航天飞机所遇到的单粒子翻转事件进行了考查和研究.结果证实在极光区和南大西洋异常区仍可能发生大量单粒子事件,大大地影响到航天器的安全,对此文中给出了一些结论和建议. | 古士芬 臧振群 师立勤 吴中华 | 1998 | 空间科学学报1998，18，3： | 8 |
| 3 | 空间单粒子故障容错设计的验证技术研究显示文摘由于空间环境的特殊性,可靠性成为航天器的重要指标,容错设计在航天关键电子元器件中必不可少。在航天器进入太空之前,为了模拟空间辐射效应,文中采用一种新颖方法对航天关键电子元器件进行单粒子故障注入,同时通过软件配合测试的方式,达到验证其容错结构的目的。采用了该技术的面向空间应用的高性能高可靠32位嵌入式RISC处理器取得了一次流片成功的结果。 | 段青亚 黄士坦 辛明瑞 | 2007 | 微电子学与计算机2007，24，11： | 7 |
| 4 | 适用于空间环境下的FPGA容错与重构体系显示文摘FPGA极大地提高了电子系统设计的灵活性和通用性,被广泛地应用在各个领域。在空间环境中,FPGA容易受到SEU的影响而导致内部逻辑的紊乱,系统重构与故障恢复也比较困难。该文提出了一种在星载环境下,使用CPLD对FPGA进行基于错误诊断的容错体系结构设计,兼顾到了系统重构与故障恢复,在实验中取得了较好的效果。 | 徐斌 王贞松 陈冰冰 章立生 | 2007 | 计算机工程2007，33，3： | 7 |
| 5 | Monte Carlo simulation based on Geant4 of single event upset induced by heavy ions显示文摘The present work is a computational simulation of single event upset(SEU) induced by heavy ions passing through the device with Geant4-tool based on Monte Carlo transport code.Key parameters affecting SEU occurrence are examined,and related geometrical construction and critical charge are quantified.The MUlti-Functional Package for SEU Analysis(MUFPSA) has been successfully programmed and applied for SEU occurrence after the completion of device geometrical construction,critical charge,and SEU cross section calculation.The proposed MUFPSA has yielded a good agreement with MRED.Specifically,the results show that higher LET incident ions lead to increased SEU vulnerability due to more diffusion and higher energy deposition.In addition,the analytical method of radial ionization profile provides a good complementary interpretation. | GENG Chao LIU Jie ZHANG ZhanGang HOU MingDong SUN YouMei XI Kai GU Song DUAN JingLai YAO HuiJun MO Dan LUO Jie | 2013 | Science China(Physics,Mechanics & Astronomy)2013，56，6： | 6 |
| 6 | Multi-objective evolutionary design of selective triple modular redundancy systems against SEUs显示文摘To improve the reliability of spaceborne electronic systems,a fault-tolerant strategy of selective triple modular redundancy(STMR)based on multi-objective optimization and evolvable hardware(EHW)against single-event upsets(SEUs)for circuits implemented on field programmable gate arrays(FPGAs)based on static random access memory(SRAM)is presented in this paper.Various topologies of circuit with the same functionality are evolved using EHW firstly.Then the SEU-sensitive gates of each circuit are identified using signal probabilities of all the lines in it,and each circuit is hardened against SEUs by selectively applying triple modular redundancy(TMR)to these SEU-sensitive gates.Afterward,each circuit hardened has been evaluated by SEU Simulation,and the multi-objective optimization technology is introduced to optimize the area overhead and the number of functional errors of all the circuits.The proposed fault-tolerant strategy is tested on four circuits from microelectronics center of North Carolina(MCNC)benchmark suite.The experimental results show that it can generate innovative trade-off solutions to compromise between hardware resource consumption and system reliability.The maximum savings in the area overhead of the STMR circuit over the full TMR design is 58%with the same SEU immunity. | Yao Rui Chen Qinqin Li Zengwu Sun Yanmei | 2015 | Chinese Journal of Aeronautics2015，28，3： | 6 |
| 7 | 基于看门狗的星载软件抗SEL、SEU保护系统设计显示文摘一般对星载计算机都要求可靠性高 ,重量轻 ,体积小 ,希望硬件设计尽量少用或不用冗余系统来保证可靠性 .研究尽量少采用硬件冗余而采用看门狗措施来保证星载系统可靠性的方法 .看门狗分为软件看门狗和硬件看门狗 ,分别设在星载机不同位置 .根据故障时间的长短 ,不同看门狗启动不同级别的保护措施 .系统采用先处理软件故障 ,后处理硬件故障 ,保护级别逐步升级策略 .提出了星载计算机五级保护策略和各保护级别的启动条件 ,对各种看门狗进行设计 ,并通过仿真实验证明了该方案的可行性 . | 卢东昕 滕丽娟 洪炳熔 高峰 | 2001 | 哈尔滨工业大学学报2001，33，1： | 5 |
| 8 | 静态随机存储器单粒子翻转效应的二维数值模拟显示文摘采用MEDICI二维模拟软件对静态存储器SRAM的单粒子翻转(SEU)现象进行了计算。对MOSFET漏区模拟得到的结果与电荷漏斗模型相吻合,表明所建立的物理模型的正确性。通过输入不同粒子的线性能量传输LET值,得到了某一结构器件的收集电荷与LET值的关系曲线,并给出临界电荷7 73×10-14C。 | 郭红霞 陈雨生 周辉 贺朝会 李永宏 | 2003 | 原子能科学技术2003，37，6： | 5 |
| 9 | 计算机RAM检错纠错电路的设计与实现显示文摘分析了在空间环境下影响RAM可靠性的主要因素及主要故障模式,介绍了利用FPGA实现RAM 检错纠错电路的方法,给出了仿真结果,并将此方法同用中小规模集成电路实现RAM EDAC的方法进行了比较。 | 刘淑芬 崔星 | 2003 | 航天控制2003，21，4： | 5 |
| 10 | Bitstream decoding and SEU-induced failure analysis in SRAM-based FPGAs显示文摘Reconfigurable SRAM-based FPGAs are highly susceptible to radiation induced single-event upsets (SEUs) in space applications.The bit flip in FPGAs configuration memory may alter user circuit permanently without proper bitstream reparation,which is a completely different phenomenon from upsets in traditional memory devices.It is important to find the relationship between a programmable resource and corresponding control bit in order to understand the impact of this effect.In this paper,a method is proposed to decode the bitstream of FPGAs from Xilinx Corporation,and then an analysis program is developed to parse the netlist of a specific design to get the configuration state of occupied programmable logic and routings.After that,an SEU propagation rule is established according to the resource type to identify critical logic nodes and paths,which could destroy the circuit topological structure.The decoded relationship is stored in a database.The database is queried to get the sensitive bits of a specific design.The result can be used to represent the vulnerability of the system and predict the on orbit system failure rate.The analysis tool was validated through fault injection and accelerator irradiation experiment. | WANG ZhongMing YAO ZhiBin GUO HongXia LV Min | 2012 | Science China(Information Sciences)2012，55，4： | 5 |
| 11 | An advanced SEU tolerant latch based on error detection显示文摘This paper proposes a latch that can mitigate SEUs via an error detection circuit.The error detection circuit is hardened by a C-element and a stacked PMOS.In the hold state,a particle strikes the latch or the error detection circuit may cause a fault logic state of the circuit.The error detection circuit can detect the upset node in the latch and the fault output will be corrected.The upset node in the error detection circuit can be corrected by the C-element.The power dissipation and propagation delay of the proposed latch are analyzed by HSPICE simulations.The proposed latch consumes about 77.5%less energy and 33.1%less propagation delay than the triple modular redundancy(TMR)latch.Simulation results demonstrate that the proposed latch can mitigate SEU effectively. | Hui Xu Jianwei Zhu Xiaoping Lu Jingzhao Li | 2018 | Journal of Semiconductors2018，39，5： | 5 |
| 12 | A novel layout for single event upset mitigation in advanced CMOS SRAM cells显示文摘A novel layout has been proposed to reduce the single event upset(SEU) vulnerability of SRAM cells.Extensive 3-D technology computer-aided design(TCAD) simulation analyses show that the proposed layout can recover the upset-state much easier than conventional layout for larger space of PMOS transistors.For the angle incidence,the proposed layout is immune from ion hit in two plans,and is more robust against SEU in other two plans than the conventional one.The ability of anti-SEU is enhanced by at least 33% while the area cost reduced by 47%.Consequently,the layout strategy proposed can gain both reliability and area cost benefit simultaneously. | QIN JunRui LI DaWei CHEN ShuMing | 2013 | Science China(Technological Sciences)2013，56，1： | 4 |
| 13 | Clinical value of Tongguanteng(Radix seu Herba Marsdeniae Tenacissimae) extract combined with chemotherapy in the treatment of advanced non-small cell lung cancer: a Meta-analysis显示文摘OBJECTIVE: To investigate the clinical efficacy and safety of Tongguanteng(Radix seu Herba Marsdeniae Tenacissimae) extract combined with chemotherapy in the treatment of advanced non-small celllung cancer(NCSLC) compared with chemotherapy alone.METHODS: Databases including Chinese National Knowledge Infrastructure, China Biology Medicine Disc, Wanfang, and MEDLINE were searched until April 1, 2014. Two assessors independently reviewed each trial. The primary outcome was the effective rate(ER) of Tongguanteng(Radix seu Herba Marsdeniae Tenacissimae) extract combined with chemotherapy. The secondary outcomes included quality of life improvement rate(QOLIR) and adverse reactions. Statistical calculations were performed by using Cochrane Collaboration Review Manager 5.2.RESULTS: A total of 888 patients from 15 studies,13 randomized controlled trials(RCT) and two controlled clinical trials, were included. Compared with chemotherapy alone, Tongguanteng(Radix seu Herba Marsdeniae Tenacissimae) extract plus chemotherapy significantly improved ER [Risk ratio(RR) =1.32, 95% CI,(1.14, 1.54)](based on 15 studies) and QOLIR [RR = 2.04, 95% CI,(1.69, 2.47)](based on 13studies). Compared with chemotherapy alone,Tongguanteng(Radix seu Herba Marsdeniae Tenacissimae) extract plus chemotherapy significantly inhibited chemotherapy-induced white blood cell decline [RR = 0.79, 95% CI,(0.70, 0.90)(based on 10 studies), chemotherapy-induced platelet decline[RR = 0.77, 95% CI,(0.60, 0.98)](based on 8 studies),and significantly alleviated nausea and vomiting(NV) [RR = 0.83, 95% CI,(0.71, 0.97)](based on 7studies). There was no significant difference in hemoglobin decline between the two therapies [RR =0.88, 95% CI,(0.70, 1.09)](based on 6 studies).CONCLUSION: This Meta-analysis suggests that Tongguanteng(Radix seu Herba Marsdeniae Tenacissimae) extract combined with chemotherapy may be more efficacious in the treatment of advanced NSCLC than chemotherapy alone. This effect includes enhancing ER and QOLIR, and weakening chemotherapy toxicity. However, large-scale RCTs are required to further investigate the short- and long-term effects of Tongguanteng(Radix seu Herba Marsdeniae Tenacissimae) extract. | Zhang Haiming Zhang Junli Ding Hao Chen Rui Liang Fengxia | 2016 | Journal of Traditional Chinese Medicine2016，36，3： | 4 |
| 14 | MOSFET单粒子翻转效应的二维数值模拟显示文摘用MEDICI二维模拟软件对MOSFET的单粒子翻转现象进行了计算 ,力图从理论上建立分析器件单粒子翻转的可靠手段 .通过输入不同粒子的线性能量传输值 ,得到了某一结构器件的翻转概率与线性能量传输值的关系曲线 .分析了不同结构参数的变化对单粒子翻转的影响 .模拟得到的结果与电荷漏斗模型相吻合 。 | 郭红霞 张义门 陈雨生 周辉 肖伟坚 龚仁喜 贺朝会 龚建成 | 2002 | 西安电子科技大学学报2002，29，4： | 4 |
| 15 | Soft error reliability in advanced CMOS technologies—trends and challenges显示文摘With the decrease of the device size,soft error induced by various particles becomes a serious problem for advanced CMOS technologies.In this paper,we review the evolution of two main aspects of soft error-SEU and SET,including the new mechanisms to induced SEUs,the advances of the MCUs and some newly observed phenomena of the SETs.The mechanisms and the trends with downscaling of these issues are briefly discussed.We also review the hardening strategies for different types of soft errors from different perspective and present the challenges in testing,modeling and hardening assurance of soft error issues we have to address in the future. | TANG Du HE ChaoHui LI YongHong ZANG Hang XIONG Cen ZHANG JinXin | 2014 | Science China(Technological Sciences)2014，57，9： | 3 |
| 16 | 重离子微束单粒子翻转与单粒子烧毁效应数值模拟显示文摘 用束径0 4μm的微束重离子数值模拟了单粒子翻转SEU和单粒子烧毁效应SEB.单粒子翻转给出了不同离子注入后漏区的电压(电流)随时间变化规律;计算了CMOSSRAM电路的单粒子翻转;给出了收集电荷随LET值的变化曲线并给出了某一结构器件的临界电荷;VDMOS器件单粒子烧毁给出了不同时刻沿离子径迹场强、电位线、电流和碰撞离化率的变化. | 郭红霞 陈雨生 周辉 贺朝会 耿斌 李永宏 | 2003 | 计算物理2003，20，5： | 3 |
| 17 | Comparison of heavy-ion induced SEU for D- and TMR-flip-flop designs in 65-nm bulk CMOS technology显示文摘Heavy ion experiments were performed on D flip-flop(DFF) and TMR flip-flop(TMRFF) fabricated in a 65-nm bulk CMOS process. The experiment results show that TMRFF has about 92% decrease in SEU crosssection compared to the standard DFF design in static test mode. In dynamic test mode, TMRFF shows much stronger frequency dependency than the DFF design, which reduces its advantage over DFF at higher operation frequency. At 160 MHz, the TMRFF is only 3.2× harder than the standard DFF. Such small improvement in the SEU performance of the TMR design may warrant reconsideration for its use in hardening design. | HE YiBai CHEN ShuMing | 2014 | Science China(Information Sciences)2014，57，10： | 3 |
| 18 | 两个低开销抗单粒子翻转锁存器显示文摘提出了两个抗单粒子翻转(SEU)的锁存器电路SEUT-A和SEUT-B。SEU的免疫性是通过将数据存放在不同的节点以及电路的恢复机制达到的。两个电路功能的实现都没有特殊的器件尺寸要求,所以都可以由小尺寸器件设计完成。提出的结构通过标准的0.18μm工艺设计实现并仿真。仿真结果表明两个电路都是SEU免疫的,而且都要比常规非加固的锁存器节省功耗。和传统的锁存电路相比,SEUT-A只多用了11%的器件数和6%的传输延时,而SEUT-B多用了56%的器件数,但获得了比传统电路快43%的速度。 | 王亮 赵元富 岳素格 | 2007 | 微电子学与计算机2007，24，12： | 3 |
| 19 | BRAM存储器EDAC容错技术可靠性分析显示文摘SRAM型FPGA内部高密度BRAM存储模块作为用户存储资源,在空间运行中易受单粒子翻转效应影响,造成用户数据失效,EDAC技术被广泛采用作为其容错手段。对于商用型SRAM-FPGA,编码/解码模块可靠性对EDAC容错技术有效性具有很大影响,因此本文在考虑编码/解码模块可靠性影响情况下,对商用SRAM-FPGA内嵌BRAM存储器进行EDAC容错技术可靠性建模,并得到提高BRAM可靠性需满足的编码/解码模块的可靠性参数限制条件关系式,最后通过仿真验证其模型的合理性及限制条件关系式的正确性,为相关工程设计中SRAM型FPGA的BRAM存储器EDAC容错技术的可行性设计提供指导。 | 伊小素 邓燕 潘雄 江云天 张家铭 | 2011 | 航天控制2011，29，5： | 3 |
| 20 | 拉曼光谱结合统计分析对不同产地黄芪饮片的鉴别分类研究显示文摘利用拉曼光谱技术结合主成分分析(PCA)及偏最小二乘判别分析(PLS-DA),建立黄芪饮片产地鉴别方法.实验检测获取了来自山西、甘肃、内蒙古、黑龙江、陕西等五产地共300批次黄芪饮片的拉曼光谱,通过PCA法对不同产地样本进行判别区分,利用PLS法建立产地判别模型并予以验证.结果表明:基于拉曼光谱良好的特异性,结合PCA及PLS-DA等方法,可实现黄芪饮片产地的快速鉴别.该方法还可拓展应用于其他饮片产地鉴别及饮片真伪判别,具有良好应用前景. | 黄浩 李洁 陈荣 冯尚源 林居强 黄祖芳 李永增 陈伟炜 俞允 林多 林佳 | 2014 | 福州大学学报(自然科学版)2014，42，4： | 3 |
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